摘要
描述了自动测试系统内置的算法图形产生器(ALPG)模块,对它的硬件结构、测试图形程序构成以及测试算法等方面进行了研究。
The ALPG(Algorithmic Pattern Generator)module in ATE(Automatic Test Equipment)is de-scribed in this paper.And some research on the module is given which includes the architecture of hard-ware,the structure of test pattern program and the test algorithm.
出处
《电子工业专用设备》
2004年第11期37-40,共4页
Equipment for Electronic Products Manufacturing
关键词
算法图形产生器
自动测试系统
存储器
SOC
ALPG(Algorithmic Pattern Generator)
ATE(Automatic Test Equipment)
memory
SoC
