摘要
本文采用衰减全反射(ATR)方法,在入射光束角度扫描和入射光波长扫描条件下测定,银—空气、银—有机染料(罗丹明B)不同界面的银膜和染料的厚度、复介电常数。并且获得金属电子气Drude模型几个重要参量:电子散射弛豫时间τ、正离子背景介电常数ε(∞)、等离子体频率ω_p、表面波频率ω_s等。也获得ATR谱共振吸收波长、共振角度和最大吸收率的规律。
This paper describes Attenuated Total Reflection (ATR) method with chang-ing angle and changing wavelength in Ag--air and Ag--RhB--air system. Thethickness and complex dielectric function of the Ag films are measured. TheDrude parameters of the Ag films are got: τ,the electron scattering rate, ε(∞),the core polarizability,ω_p the plasma frequncy, ω_?, and the surface wave fre-quncy etc. At the same time, we got some regularities of ATR spectrum onresonance absorbed wave length, resonance angle and maximum absorbance.
