测微晶尺寸及微观应变的单峰傅氏分析法

ON CRYSTALLINE SIZE AND MICROSTRAIN WITH FOURIER' S SINGLE PEAK

从理论上探讨了测微晶尺寸及微观应变的Ｘ射线单峰傅氏分析法，并用由此理论编制的计算机软件进行了实际测量，实测表明这是一种快速、简便、准确的方法．

A method of using Fourier' s analysis of single peak to measure crystalline size and microstrain has theoretically discussed. Based on the method, a new software was built up to take the relevent measurement, and the results show it to be a quick, simple,and accurate way in the research work..