高纯碲中杂质的辉光放电质谱分析

The trace impurities in high purity Te were measured by use of VG9000 glow discharge mass spectrometer (GDMS). Results showed that the stability of analytical performance and the accuracy of analytical results can be assured by means of optimizing the glow discharge conditions and effective eliminating interference. The test results are based on the average value of the three-time tests. The reproducibility and accuracy of the test data indicated that GDMS is a useful tool for elemental analysis of high purity solid samples.