新型片式铌电容器老化方法的研究

Research on Aging Method for New-Type Niobium Chip Capacitor

根据铌电容器的失效状态,针对片式铌电容器后期筛选工艺进行研究,在通用的静态老化方法基础上引入了一种动态老化方法,并通过实验确定了这两种老化方法合理的老化工艺参数。采用静态老化与动态老化相结合的老化方法,可以进一步提高片式铌电容器产品的可靠性,满足工业化应用的要求。

In this paper,a study is made of the screening techniques of niobium capacitor during the end processes in accordance with its special failure model. A dynamic aging method is suggested based on conventional steady aging method,and the proper parameter values are determined through experiments. The results of experiments show that use of steady and dynamic combined aging method can improve reliability of niobium capacitor, thereby meeting the requirements of industrial applications.