摘要
用高纯锗作为中心探测器,两块塑料环型晶体作为外围探测器建成了一台三晶电子对谱仪。对于24Na源2.754MeVγ射线的双逃逸峰,只用高纯锗探测器测得峰与它附近本底比为8.6,制成的塑料闪烁体-高纯锗三晶电子对谱仪,上述双逃逸峰与它附近本底比为430,改进了50倍。
A be Crystal pair spectrometer is built up using a high parity De(HPGe) as central detector and two plastic annular scintillators as the outside detector. The ratio of the 24Na 2.754MeV γ roy double escaping peak to adjacent continual background is 8.6 when detected with the HPGe only but is 430 when detected with the Pair spectrometer, the artual improvement factor is 50.
出处
《分析测试技术与仪器》
1994年第1期7-11,共5页
Analysis and Testing Technology and Instruments