摘要
对黄斑瓷壳和正常瓷壳进行了电性能测试、化学及烧氢烘烤等一系列试验,证明了高压老炼后真空灭弧室瓷壳黄斑的形成是由于氧化铝晶格配位结构的变化引起的,它不影响真空灭弧室的电气性能,而且加热至650℃后即可消除。
With a series of experiments, including electric and chemical tests and calcinations in hydrogen or in vacuum, the reason of formation of the yellow specks in ceramics is found out. It is due to the change of construction of crystal lattice in Al2O3 crystal. When heated up to 650 ℃, the yellow speck can fade away. The yellow speck has nothing with the electrical behavior of the vacuum interrupter.
出处
《高压电器》
CAS
CSCD
北大核心
2004年第6期431-432,共2页
High Voltage Apparatus
基金
国家自然科学基金项目(50377003)
关键词
真空灭弧室
瓷壳黄斑
烧氢
真空烘烤
氧化铝晶体
vacuum interrupter
yellow speck in ceramic
calcinations in hydrogen
calcinations invacuum
Al2O3 crystal
