次条纹积分莫尔偏折术自动测量位相物体温度场

Research of Subfringe Integration Method for Moiré Deflectometry and the Measurement of Phase Object Temperature Field

从理论上论述了莫尔条纹偏折术用于对位相物体温度场的测试原理和方法,以及轴对称温度场的数学再现方法;推导出用于提高莫尔偏折术测量精度的计算方法—次条纹积分法(SIA).SIA的主要思路是在空间域内使用"N段积分法"解调条纹位相,从而扩大计算数据量,实现测量精度的提高.由计算可知,使用次条纹积分法可获得精度优于λ/50的测量结果,远远高于直接测量的测量精度.

In this paper, the basic principle of the Moiré deflectometry used for the phase object in experiment research is illustrated, and the mathematical reconstruction method of axis-symmetric temperature field is showed. A subfringe integration algorithm (SIA) is presented to ensure high measurement accuracy. In the SIA method, the phase is demodulated using“N-bucket integration” in the spatial domain, and the initial phase of every pixel can be obtained. The measurement result of SIA can give an accuracy of λ/50 fringe interval which is higher than those of the other fringe phase analysis methods.