显微干涉网格法实现平面物体表面应变的复位测量

THE RESET MEASUREMENT OF STRAIN ON THE SURFACE OF PLANE OBJECT BY MICRO INTERFERENCE GRID METHOD

采用显微干涉光路，使被测物体表面光栅的±１级衍射光相互干涉，用显微ＣＣＤ图象采集系统采集干涉后形成的倍增光栅，利用微网格法原理和信息转换技术提取每一幅倍增光栅图象的几何特征，确定被测物体表面的应变．通过分析证明，这种光路能实现平面物体表面应变的复位测量，为在变形过程中空间位置发生变化的平面物体表面应变的测试提供了一种新方法．

In this paper, the grating′s ±1 order diffractive beams of the object′s measured surface are interfered each other by using the micro interference system. The multiplier grating caused by interference is recorded using micro CCD image gather system. The geometric characteristic of every multiplier grating imagine is taken to determine the strains on the surface of measured object on the basis of the principle of micro grid method and the information transform technic. It is proved that the reset measurement of strain on the surface of the measured plane object can be realized with this micro interference system. This offers a new method for the determination of the strain on the surface of plane object which changes its space location in the course of deformation.