摘要
基于谐振腔微扰技术 ,利用先进的矢量网络分析仪 ,结合虚拟仪器技术研制了一套测量薄膜微波电磁参量的自动测量系统 .该系统可以方便、快捷地测量薄膜在微波频率下的复介电常数和复磁导率 .图形化编程语言LabVIEW大大缩短了系统开发时间 。
Based on the perturbation theory, an automatic measurement system of virtual instrumentation by advanced vector network analyzer was developed for measuring electromagnetic parameters of nano-magnetic thin films materials under microwave frequency. By means of this system, the complex permittivity of thin films samples and its complex permeability can be measured quickly and accurately. LabVIEW, a kind of graphic programming language can reduce development time and improve programming efficiency.
出处
《华中科技大学学报(自然科学版)》
EI
CAS
CSCD
北大核心
2004年第11期54-55,58,共3页
Journal of Huazhong University of Science and Technology(Natural Science Edition)
基金
国家自然科学基金资助项目 (5 0 3710 2 9)
湖北省自然科学基金资助项目 (2 0 0 2AB0 33)
关键词
薄膜
测量
复介电常数
复磁导率
thin film
measurement
complex permittivity
complex permeability