高分辨率快速成型系统的光固化实验研究

Experimental Investigation on High-Resolution Stereolithography System

研究了高分辨率激光快速成型系统中制作参数对固化线宽及固化深度的影响.制作出了固化线宽为12 33μm、固化深度为28 33μm的固化线,表明该系统具有制作细微结构特征的能力.实验结果表明,固化线宽、固化深度随激光功率与扫描速度比值的增大而增大,和普通快速成型系统相比,在相同扫描条件下,该高分辨率快速成型系统制作的固化线线宽更小且固化深度更大.在不同制作条件下,利用最小二乘法得出了固化线宽、固化深度关于激光功率与扫描速度比值的预测模型,利用该模型来预测固化线宽和固化深度,为准确实现线宽补偿及分层厚度的合理设定提供了依据.

To accurately fabricate microstructures with the high-resolution Stereolithography (SL) system newly developed by Xi'an Jiaotong University, experimental studies were carried out to investigate the influences of the build parameters on the cured line width and depth in the novel SL system. Cured line with a width of 0.012 mm and a depth of 0.028 mm was fabricated in the experiment to show the capability to build microstructures of the new SL system. The experimental results indicate that cured depth and width increase with the increasing ratio of laser power to scanning speed. And it is found that the cured line built with the high-resolution SL system is smaller in width and deeper in depth compared with the cured line fabricated with the current SL system under the same scanning condition. Based on the cured line width and depth obtained in the experiment, empirical laws predicting cured line width and depth according to the ratio of laser power to scanning speed in the SL system are established with a least-square fitting. The cured line width and depth predicted by the empirical laws provide a foundation to set up accurate line width compensation and appropriate layer thickness in the high-resolution SL system.