全谱直读等离子体发射光谱法测定高纯金中的杂质元素

Impurity Determination in High Purity Golden Materials by Inductively Coupled Plasma Optical Emission Spectroscopy

用新型号的全谱直读等离子体发射光谱仪测定了高纯金中的杂质元素,进行了分析谱线的选择,功率、气体流量等工作条件的优化,选用内标法校正标准溶液与样品溶液基体不同的影响。取样量为0.5g时,方法的测定下限为0.02～4.67μg/g,回收率在90%～101%,当待测元素含量大于5μg/g时,分析结果的相对标准偏差小于5%。方法用于实际样品的分析,结果与其他方法相符。

High purity golden materials are economically important and the grade of which depends on the impurity levels in the materials. The purity analysis for the materials is generally accomplished by AAS in China. In this paper, an ICP-OES method is developed with a latest model ICP-OES spectrometer, SPECTRO CIROS^(CCD). The instrumental parameters are optimized and internal standard method is adopted to compensate for the matrix differences between calibration standards and sample solutions. The detection limits of the method for different elements are from 0.02 to 4.67 μg/g. The recoveries of the method for these elements are 90%～101% with precision of less than 5% RSD. The method has been applied to the determination of these elements in samples and the results are in agreement with those provided by other methods.