逐行复位快闪式CMOS焦平面读出电路的测试方法

Testing Method of Reset Row-by -row Snapshot Charge Amplifier CMOS Readout IC for Focal Plane Array

介绍了一种逐行复位快闪CMOS焦平面读出电路的测试方法及测试结果。该电路基于电荷转移原理 ,采用逐行复位方式。基于测试考虑 ,设计了模拟光电流的测试管 ,和可调节的工作时序。设计了一种新的测试方法测量出了内部寄生参量。

The testing method and measurement results of RRSCA(Reset Row-by-row Charge Amplifier) are presented in this paper.That circuit works based on charge transfer principle and resets row by row.For testing,test MOSFETs are inserted for testing to simulate the photo current,and the circuit timing can be adjusted to change the work mode.A novel testing method is introduced for measuring the inner parasitic parameters.The other important parameters are also measured.