摘要
结合激光干涉及图像处理技术研究测量透明颗粒形状及监测其变形的光学系统 ;对共路偏光干涉仪进行改进 ,使之更好地测量由温度场变化引起的小试件变形 ;对柱及球形试件进行理论和数值分析及实验研究 .
A technique combining image processing and laser interferometry for measuring transparent grain shape and detecting its deformation is proposed.A common-path polarizing interferometer is developed for the sample deformation detection.A theoretical and numerical analysis of the spherical and cylindrical samples is carried out.The result is in good agreement with the experimental data.
出处
《同济大学学报（自然科学版）》
EI
CAS
CSCD
北大核心
2004年第12期1627-1630,共4页
Journal of Tongji University:Natural Science
关键词
偏光干涉仪
透明颗粒
共路干涉
图像处理
显微
polarizing interferometer
transparent grain
common path
image processing
microscopy
