摘要
利用SEM电镜测试和X射线衍射测试验证了纳米SiO2和纳米LS在RTVSR中的分散性;借助FT IR红 外光谱和光学聚焦法测试研究了RTVSR/SiO2和RTVSR/LS两种纳米复合材料的憎水性及憎水迁移性;同时测试分析了两种纳米复合材料的tanδ、ρ和耐漏电起痕等基本电气性能指标。试验证明RTVSR在改性后仍具有好的憎水性和憎水迁移性,且其电气性能指标仍符合要求。
The dispersivity of nano SiO2 and nano LS in RTVSR is examined by SEM and XRD. The hydrophobicity and migration of hydrophobia of the RTV nano-composite SR/SiO2 and SR/LS are studied by FT-IR and OFF. At the same time, the basic electrical properties are tested and analyzed, such as trace of leakage current, tanδ, ρ and hydrophobia contact angle. The tests prove that RTV nano-composite SR/SiO2 and SR/LS is better in migration of hydrophobia and hydrophobicity, and their electrical properties are still at level to meet requirement.
出处
《高电压技术》
EI
CAS
CSCD
北大核心
2005年第1期27-29,共3页
High Voltage Engineering
关键词
室温硫化硅橡胶
纳米复合材料
憎水性
电气性能
RTV silicone rubber
nano-composites
hydrophobicity
electrical properties
