机电设备BIT虚警问题的传感层影响因素分析和数学模型分析

Physical and Mathematical Analyses of Impactive Factors at Sensor Level on the FAR in BIT Systems of Mechatronics Equipments

机内测试 (BIT)系统的虚警率是影响 BIT正常使用的主要问题之一。与电子系统相比 ,由于机电设备的功能和结构的复杂性使得其测试性问题更复杂 ,其中的虚警问题更加突出。研究以机电设备 BIT系统为背景 ,从传感层对虚警率的影响因素着手 ,进行系统分析。首先基于 BIT系统传感层的物理特性分析虚警率的影响因素并进行归纳和提炼 ;其次 ,提出 BIT虚警率的分析模型 ,基于该模型分析结果 ,为降低 BIT系统中的虚警率 ,提出嵌入 BIT传感层数据异常检测和恢复功能的 BIT改进模型 ,并分析了该模型的有效性 ,导出改进模型中影响虚警率的主要特性参数。最后在某船舶动力装置 BIT系统中进行了初步验证。

The high FAR is one of the problems that prevented built-in test (BIT) systems from application. Mechatronics equipments appeal for higher testability and the FAR problem is more notable than electronic systems. A systematic analysis was made on the impactive factors on the FAR of BIT systems at the sensor level. These factors were induced based on the analysis of the physical characteristic of the BIT systems at sensor level. Then a probability model of FAR in BIT systems was presented. Based on the analysis of the model, an improved model embedded with detection and recovery of abnormal sensory data was proposed in order to reduce FAR in BIT systems. Compared with the original model, the model was validated. The characteristic parameters that influenced the FAR in BIT systems were induced. At last some experiments were done to prove the feasibility of the model.