内嵌快闪存储器的测试优化与分析

Test Optimization & Analysis of Embedded NVM

由于对快闪存储器的广泛应用,对优化测试和可靠性日益迫切的要求成为一大重要挑战。因此,本文通过分析阐述如何合理有效应用夺路并行测试策略,可以更有效的在快闪存储器测试时间和产量方面达到很好的平衡。

This paper introduces the test optimization and analysis by demanding to improve cost and reliability of NVM. By using emerging test strategies for efficient multi-site techniques, we can achieve greater trade-off in test time and throughput necessary for testing new flash devices.