摘要
利用电喷雾质谱(ESI-MS)的源内CID(in-source Collision Induced Degradation, in-source CID)对2，2′-联吡啶-4，4′-二羧酸乙酯与铼络合染料(化合物1)和钌络合染料(化合物2)进行研究，表征了络合物及其配体的相对稳定性结果表明，随CID电压的升高，化合物1的吡啶配体容易脱落，并形成稳定的联吡啶三羰基配位离子[(4，4′-(COOEt)2-bpy)Re(CO)3]^+；而化合物2在较高的CID电压下会发生联吡啶环上取代基的中性丢失，其单电荷离子比二价电荷离子稳定。
The ESI-MS spectra of compound 1 ([(4,4'-(COOEt)_2-bpy) Re(CO)_3pyPF_6] )and 2 ([Ru(bpy)_2(4,4'-(COOEt)_2-bpy)2PF_6]) were studied under different in-source CID fragmentation. The stability of the compounds and their ligands was characterized. The Experimental results showd that the pyridyl ligand in compound 1 dissociated easily to become [(4,4'-(COOEt)_2-bpy)Re(CO)_3]^+ with the increase of CID fragmentation. The substituted group on the bipyridyl ligand in compound 2 lost C_2H_4 neutral molecule under a higher CID fragmentation (such as CID 110 V), and its single charge ion was more stable than its double charge ion.
出处
《染料与染色》
CAS
2004年第6期325-326,370,共3页
Dyestuffs and Coloration
基金
国家重点基础研究专项经费资助国家自然科学基金(项目批准号20128005)
