摘要
本文提出用伏安法测绘二极管伏安特性曲线的一种电路新接法 ,用该接法测量时 ,不需修正即可完全消除电表内阻的影响。
A new way to connect electric circuit to measure the characteristic curre of semiconductor diode with the voltmeter ammeter method is introduced.The influence of the internal resistance of the electrometer can be got rid of completely without any revision when the method is adopted.
出处
《大学物理实验》
2000年第3期41-43,共3页
Physical Experiment of College
关键词
二极管
接法
伏安特性曲线
电路
消除
电表内阻
伏安法
测量
semiconductor diode
voltmeter ammeter method
characteristic curre
the internal resistance of the electrometer
