期刊文献+

瞬态卡计法测定涂层的半球总发射率 被引量:2

Transient Calorimetric Technique for Measuring Total Hemispherical Emittance of Coatings
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摘要 本文描述了一台瞬态卡计法测定涂层的半球总发射率(?)的装置.用它可以在一次测试过程中连续测定样品在常温和低温相当宽的范围(-130~+140℃)内的半球总发射率值,误差<6%.本文详细地介绍了测试和数据处理方法,分析了误差,并提供了若干金属、阳极氧化铝、涂料型无机涂层和等离子喷涂涂层等样品在不同温度下发射率的测试结果,并进行了讨论. A detail is given of an apparatus for the transient calorimetric technique,including theexperimental procedure and data analysis,used for measuring total hemispherical emittance ofcoatings at normal and low temperatures.By taking account of the heat loss,the emittances ofthe specimens can be more accurately evaluated.The analysis of errors shows an uncertaintyof less than 6%.The results of some metals and inorganic coatings(bright and black anodizedaluminum,paints,plasma-sprayed coatings)in the range of-130~140℃ are presented.
出处 《无机材料学报》 SCIE EI CAS CSCD 北大核心 1993年第2期234-242,共9页 Journal of Inorganic Materials
关键词 发射率 卡计法 涂层 金属 Emittance Calorimetric technique Coatings Metals
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参考文献5

  • 1程曙霞,High Temp-High Pressure,1984年,16卷,459页
  • 2程曙霞,太阳能学报,1981年,2卷,3期
  • 3李明华,1978年
  • 4程曙霞,1974年
  • 5许勤堂,工程热物理学报

同被引文献19

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  • 9S. Moghaddaml, J. Lawlerl, J. Curranol, J. Kim, "A Space- Based Experiment to Evaluate Performance of Electrostatic Switched Radiator (ESR)," in proceedings of Space Technology and Applications International Forum ( STAIF-2007 ), edited by M. S. E1-Genk, AIP Conference Proceedings, 880, Melville, New York, 2007, p. 66 -72.
  • 10H. Demiryont, K. C. Shannon, " Variable Emittance Eleetrochromic Devices for Satellite Thermal Control," in the in proceedings of Space Technology and Applications International Forum (STAIF-2007), edited by M. S. El-Genk, AIP Conference Proceedings, 880, Melville, New York, 2007, p. 51-58.

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