场离子显微术在晶体缺陷研究中的应用

THE APPLICATIONS OF FIELD ION MICROSCOPY IN THE RESEARCH ON CRYSTAL DEFECTS

本文概述了场离子显微术(FIM)及原子探针微区分析方法(AP)的基本原理及其在晶体缺陷研究方面应用的新进展。重点介绍此实验方法在金属间化合物及扩散相变产物的微结构和有关晶体缺陷,如点缺陷,位借,界面结构和第二相析出物超微颗粒的研究方面的新结果。

The principle and the progress in the applications of the field ion microscopy and atom probe microanalysis technique in studying crystal defects have been reviewed. Em phasize was put on the new results of the investigations on defects and microstrnctures , such as point defects, dislocations, interfaces and ultrafine precipitates in intermetallic compounds and other systems experiencing diffusive phase transformations.