一种新的模拟集成电路输出参数测试方法

A New Measurement Method for Analog Integrated Circuit Output Parameters

提出一种新的、基于行列式判决图的模拟集成电路输出参数测试方法。利用 Laplace展开 ,可以建立被测电路导纳矩阵的行列式判决图 ,从而计算出其输出参数—例如增益和截止频率。对于大规模模拟电路来说 ,由于导纳矩阵的稀疏性和行列式子图的共享性 ,该方法能够有效地测试出被测电路的输出参数。

A new measurement method based on determinant decision diagrams (DDDs) for analog integrated circuit output parameters is presented. Using Laplace expansion, DDDs can be constructed for admittance matrix of circuit under test. Then the output parameters, e.g., gain and cut-off frequency can be calculated. For large scale analog circuits, this method can efficiently measure it's output parameters due to sparsity of admittance matrix and sharing of determinant subgraphs.