基于微分灵敏度计算的模拟集成电路故障定位

Analog Integrated Circuit Fault Location Based on Differential Sensitivity Computation

提出了一种基于微分灵敏度计算的模拟集成电路故障定位方法。利用故障电路输出参数相对偏差的二阶 Taylor级数展开和 Newton- Raphson算法可以计算出各元件的相对偏差值。实验结果表明 ,该方法能够准确地进行模拟集成电路故障定位 ,特别是软故障定位。

One method of analog integrated circuit fault location based on differential sensitivity computation is presented. The relative deviation of each component can be calculated by using the second-order Taylor series expansion of the relative deviation of the output parameter of fault circuit and Newton-Raphson algorithm. The experimental results demonstrate that this method can locate precisely the analog integrated circuit faults, especially the soft faults.