铍材表层残余应力测试方法研究

Evaluation of Residual Stresses on Beryllium Surface By Glancing X-Ray

传统X射线法由于透入深度太大,不能用来测定铍的表层残余应力,本文提出掠射法衍射几何,使入射X射线以很小的角度掠射进入样品表面,并导出相应的应力计算公式,可有效地解决此问题,为研究铍制构件尺寸稳定性与残余应力关系奠定了基础。

In this paper, a new diffraction geometry was designed for glancing X-Ray beam to project onto the samole surface with a small angle, and a new formular was derived for stress calculation in terms of elastic mechanics.To make verifications on the proposed method, the residual stresses introduced by various mechanical processes on the sruface layer of beryllium were measured, and the stress distribution through the depth was evaluated by changing the glancing angles stresses of step by step. This method laid the foundation of studying the stability and residual Be products.