交流粉末电致发光器件老化性能的研究

Studies on Deteriorative Properties of Powder AC-EL Devices

介绍了交流粉末电致发光器件老化性能测试的一种新方法,即利用拟合公式和双对数坐标绘制发光器件的老化特性曲线。只要有一定数量的老化试验数据,就可估计得到长寿命的发光器件的半寿命、L_0/3寿命、L_0/4寿命等。这样,不但可提高工作效率,大大缩短交流粉末电致发光器件的研究周期,并且具有实际应用价值。

This paper introduces a new method of testing deteriorative properties of powder AC-EL devices. In this method a deteriorative curve of the device can be drawn by using fit formula and double-logarithmic plotting. Therefore, only if there are some data of deteriorative experiment, we can estimate the long-lived devices' half-lives, L0/3-lives, L0/ 4-lives, etc. So this method can not only improve the working efficiency and shorten the researching circle greatly, but also has great value for pratical applications of the AC-EL devices.