故障熵和故障测试优化

Fault Entropy and Optimization of Fault Test

为了提高单故障可及性电路故障测试的有效度,减少测试次数,从信息论的角度来分析电路故障测试的过程,提出了故障熵和故障信息量的概念,同时提出了电路故障测试的一种优化方法,并将其运用于实际的电路故障测试优化中。

In this article, the test process of circuit fault is analysed in terms of information theory, for the purpose of improving the test vadility of single-fault accessibility circuit and reducing the test times. The concepts of fault entropy and amount of information are proposed, and an optimization method of circuit fault test as well, which is applied to optimizing the practical circuit fault test.