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Principle of Coordinates Acquisition Based on Single Camera 被引量:5

Principle of Coordinates Acquisition Based on Single Camera
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摘要 The principle and accuracy of 3-D coordinates acquisition using one single camera and the Aided Measuring Probe(AMP) are discussed in this paper. Using one single camera and one AMP which has several embedded targets and one tip with known coordinates, the single camera′s orientation and location can be calculated. After orientation, the global coordinate system is obtained. During measurement, the camera is fixed firstly, then the AMP is held and the feature point is touched.The camera is triggered lastly. The position and orientation of the AMP are therefore calculated from the size and position of its image on the sensor. Since the tip point of AMP has known relation with the embedded targets, the feature point can be measured. Tests show that the accuracy of length measurement is 0.2 mm and accuracy for flatness measurement in XSY-plane is 0.1 mm. The principle and accuracy of 3-D coordinates acquisition using one single camera and the Aided Measuring Probe(AMP) are discussed in this paper. Using one single camera and one AMP which has several embedded targets and one tip with known coordinates, the single camera′s orientation and location can be calculated. After orientation, the global coordinate system is obtained. During measurement, the camera is fixed firstly, then the AMP is held and the feature point is touched.The camera is triggered lastly. The position and orientation of the AMP are therefore calculated from the size and position of its image on the sensor. Since the tip point of AMP has known relation with the embedded targets, the feature point can be measured. Tests show that the accuracy of length measurement is 0.2 mm and accuracy for flatness measurement in XSY-plane is 0.1 mm.
出处 《Transactions of Tianjin University》 EI CAS 2005年第1期49-52,共4页 天津大学学报(英文版)
关键词 单照相机 半自动测量探针 整体坐标系 定位 3-D坐标探测 3-D coordinates acquisition single camera collinear equation spatial resection aided measuring probe
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