摘要
本文从物理光学的角度出发,阐述了晶体旋转法测试液晶分子预倾角的原理,并对测试方法进行了描述。在已知液晶材料n_o和n_c的条件下,这一方法可精确测定液晶盒中液晶分子的预倾角,测试精度优于0.2度。
Depending on the principles of optics, we explained the method of crystal rotation to measure LC' s ptetilt angle, and described it in measuring technology. When the no and ne are known, the LC' s pretilt angle in no twist LC cell can be tested exactlly by this method. The accuracy is excellent over
0. 2°?
