摘要
应用俄歇电子能谱对微通道板表面发雾区域进行分析。分析结果表明,发雾区碳含量比正常区高三倍。由此可推测出,发雾是由碳污染引起的,而这种碳污染很可能是残留于微通道板上的某些有机物在烧氢时碳化所致。
Auger electron spectroscopy (AES) is used to analyze the micro- channel plate foggiug surface in this paper.The anlysis results show that a carbon content in the fogging area is three times higher than that in the normal area.From this,we draw a conclusion that the fogging results from the carbon contamination,and this kind of carbon contamination is likely to that some organic compounds remained in the microchannel plate are carbo- nated during the hydrogen firing.
出处
《应用光学》
CAS
CSCD
1993年第6期25-29,共5页
Journal of Applied Optics
关键词
微通道板
碳污染
俄歇电子谱法
Auger electron spectroscopy
microchannel plate
carbon contamination
