(CdTe—ZuTe)/ZnTe/GaAs(100)超晶格结构的X射线测定

STRUCTURE DETERMINATION OF (CdTe-ZnTe)/ZnTe/GaAs(100) SUPERLATTICE BY X-RAY DIFFRACTION

用X射线衍射,并结合X射线动力学衍射理论模型的计算机模拟方法,对(CdTe-ZnTe)/ZnTe/GaAs(100)应变超晶格材料的结构进行了研究,得到了其结构参数和信息.

The X-ray diffraction (XRD) method was used in the investigation of the structure of (GdTe-ZnTe)/ZnTe /GaAs(100) strained-layer superlattice. The diffraction profile was analysed by means of the X-ray diffraction theory and computer simulation to obtain the structure parameters and information.