摘要
分析了在空间环境下影响RAM可靠性的主要因素及主要故障模式,介绍了利用FPGA实现RAM 检错纠错电路的方法,给出了仿真结果,并将此方法同用中小规模集成电路实现RAM EDAC的方法进行了比较。
In this paper, the main factors affecting the reliability of RAM as well as the
failure modes in the space environment are demonstrated. The RAM EDAC circuit implement-
ed by FPGA is introduced. At the same time, it is compared with that realized by small and
medium-scale integrated circuits. Further more, the simulationt rdsults are given.
出处
《航天控制》
CSCD
北大核心
2003年第4期59-67,共9页
Aerospace Control
