摘要
选取了2个能准确表达用半导体α谱仪测量的α谱线的峰形函数。推荐了一种用二重峰α谱获取峰形参数的方法。采用麦夸脱方法计算非线性参数。建立了一个多重峰α谱分析程序MULT,计算了^(244)Cm和^(241)Am在衰变中发射的α粒子辐射几率以及钚样品中^(240)Pu与^(239)Pu的原子数比。并用一个标准谱检验了它的分析准确度。
Two peak shape functions are selected. They accuratly represent the form of an experimentalalpha peak obtained with semiconductor a-spectrameter. A method is proposed fitting peak pa-rameters by doublet alpha spectra. A MULT program is constructed for multiplet alpha spectra.The program are checked by applying a standard spectrum. The program MULT is used to calcu-late alpha particle emmission probabilities and ^(240)Pu/^(239)Pu atomic number ratio.
出处
《原子能科学技术》
EI
CAS
CSCD
北大核心
1993年第6期519-526,共8页
Atomic Energy Science and Technology
关键词
非线性分析
峰形函数
拟合
Α谱
Alpha spectrum
Nonlinear analysis
Peak shape function
Peak shape parameter
