K故障诊断可测性的公树条件

Common-Tree Conditions on K-Fault Testability

模拟电路Ｋ故障诊断有两种方法：超定偏差方程相容性判断法和双线性求值判断法。本文从拓朴上论述了使用这两种方法时电路的全局可测性和局部可测性，提出了简明的称为公树条件的评判方法。公树条件易于用来从可测性角度对两种诊断方法进行比较，在电路可测性设计时也方便使用。最后以一个例子说明双线性求值判断法的可测性要好得多。

There exist two algorithms for k-fault diagnosis of analog circuits. One is based on checking the consistency of overdetermined deviation equations, another is based on the bilinear deviation transformation. This paper deals with, respectively, the global testability and the local testability of faulty circuits when the two algorithms are used. Common-tree conditions on testability are proceed that can be easily used in comparison between the two algorithms and in testability design. An example is given to iuustrate that the testability using the bilinear transformation based algorithm is better than the other.