用变角X射线光电子谱(VAXPS)研究Rh/TiO_2体系的载体金属强相互作用(SMSI)

CHARACTERIZATION OF Rh/TiO_2 SYSTEM SMSI USING VARIABLE ANGLE X-RAY PHOTOELECTRON SPECTROSCOTY

用变角X-射线光电子谱(VAXPS)分析了模型催化剂Rh/TiO_2体系在还原气氛下的特点。观测到几何效应无论是其强度还是相互作用的范围,都在很大程度上依赖于TiO_2基底的表面结构。在XPS谱上,于34.52eV处发现一个新的特征峰,这很可能是Rh与被部分还原的TiO_2之间的键合所致,这处峰可以认为是Rh/TiO_2体系中电子相互作用的重要特征之一。

The behaviour of the model catalyst Th/TiO_2 systen under the reduction atmosphere was investigated using variable angle X - ray photoelectron spectroscopy (VAXPS). It was observed that geometric effect,either the intensity or the effect range,greatly depended on the surface structure of the substrate titania. A new characteristic peak at 34.5eV in XPS spectra, which could probably result from the binding between metal rhodium and partilly reduced titania, was observed. It could be considered as one of significant information of electronic interaceion for the Rh/TiO_2 system. The results in present paper give oxygen vacancy model an experimental support.