扩展激光测粒仪测量下限的一种计算方法

A new algorithm for expanding measurement lower-limit of laser particle sizer

本文提出一种求亚微米级颗粒尺寸分布的计算方法,数值计算及实测表明,这种方法能有效地将激光测粒仪的测量下限扩展至0.1μm。

In this paper, a new algorithm for solving inversion of size distribution of submicron sized small particles is proposed. Numerical simulation and experimental study demonstrate that this method can effectively expand the measurable lower limit of laser particle sizer to 0. 1μm.