摘要
报导了3 mm波段硅双漂移崩越二极管所需PN/N^+多层、亚微米外延材料的常规CVD生长技术,研究了实现这些高要求的多层结构的方法,得到了最佳的外延工艺条件。
In this paper,a vapor phase growth technique of PN/N+ multilayer submicron epitaxial material for 3 mm waveband Si DDR IMPATT diodes is pre-sented. The approaches to obtain these high quality multilayer structures are studied. The optimum epitaxial process conditions have been established.
出处
《固体电子学研究与进展》
CAS
CSCD
北大核心
1993年第3期238-243,共6页
Research & Progress of SSE