摘要
介绍了用单片微机构成的测试仪来取代在可控硅调速系统动态、静态参数测量及调试中至今应用的慢扫描示波吞测量方法，并介绍该测试仪的功能、特点及软件和硬件设计。
The introduction of the function,the charactet and the design of soft and hardware of a meter made of single chip computer for measuring dynamic and static parameter of thyristor speed control system is given.The meter can replace the slow-scan oscilloscope now being used for the measurment.
出处
《鞍山钢铁学院学报》
1994年第4期48-52,共5页
Journal of Anshan Institute of Iron and Steel Technology
关键词
测试仪
慢扫描示波器
可控硅
调速系统
meter
slow-scan oscilloscope
design of block-constraction
