摘要
讨论了微波电性能测量在GaAsMMIC研制和开发中的重要作用,研究了X和Ku波段GaAsMMICLNA微波电性能测量及其测量系统设计所要注意的有关问题。给出了相关增益、噪声系数、输入和输出驻波比的测试结果,并介绍了这两个频段GaAsMMICLNA的应用情况。
The important effects of the microwave electrical measuremrnt in developing GaAs MMIC are discussed.The measurement of X and Ku band GaAs MMIC LNA and some problems worth noticing are addressed. And the testing results about correlation gain,noise figure,input and output VSWR are presented. Finally the applications of GaAs MMIC LNA at the two bands are also introduced.
出处
《半导体情报》
1994年第4期22-25,共4页
Semiconductor Information