摘要
本文根据晶体管非工作期可靠性统计数据建立了我国晶体管非工作期失效率预计模型，经验证，预计失效率与现场失效率相吻合．通过预计模型可预计晶体管在各类环境下的非工作期失效率，尤其给出了我国晶体管普通库房贮存失效率和贮存有效期．
Abstract In this paper, a prediction model of the non-operating failure rate for home-made transistors is established on the basis of statistic data of non-operating reliability for transistors. The predicted failure rate is verified to be in agreement with the site failure rate. By using the prediction model, the non-operating failure rate for transistors under various circumstarces, especially the failure rate and term of validity for home-made transistors stored in normal warehouses can be predicted.
关键词
晶体管
失效率预计
可靠性
Failure analysis
Mathematical models
Reliability
Semiconductor devices
