摘要
采用粉末压饼制样Ｘ荧光光谱法直接测定了地质物料中的微量Ｒｂ、Ｃｓ、Ｕ、Ｔｈ、Ｚｒ、Ｈｆ、Ｎｂ、Ｂａ和Ｓｒ等元素。与其它方法相比，本方法具有制样方法简便，一次制样可以测定多种元素、成本较低等特点。试验结果表明，方法的准确度和精密度较好，各元素的检出限都能满足地质物料对测定的要求。
Rb、Cs、U、Th、Zr、Hf、Nb、Ba and Sr elements in geological materials havebeen determined directly by briqueting X ray fluoresence spectrometry(XRFS).Incontrasting with other methods,this technique is characterized by its simpleness inpreparing specimen, many tests at one time by one specimen and lower costs. The testresuIts have shown that the precisions and accuracies of the method are satisfactory andthat the method can be used to analyze geological materials.
