摘要
用射频交流溅射法制备了具有不同层厚的FeSi/Cu多层膜系列样品,通过铁磁共振谱测量发现:当Cu层厚度(d_Cu)小于15时,Fesi层间发生交换耦合,室温饱和磁化强度测量发现:d_Cu<15,磁化强度随d_Cu减小而明显下降,磁光克尔谱测量则表明:d_Cu<15时,谱线出现异常,将上述三个结果进行综合分析提出如下模型:d_Cu<15,Cu层中传导电子被反向极化,并通过RKKY相互作用使FeSi层间发生耦合,借助于Drude模型进行理论计算,得到与实验定性一致的结果。
Fesi/cu multilayer film with dirferent layer thickness is prepared by rf sputtering methed. The ferronmagnetic resonance spectra of the films shows that: when the thickness of cu layer d_Cu is lessthan 15A,the interlayer coupling between FeSi layer appears. By measuring the room temperaturesaturation magnetization,it is shuwn that the magnetization decreases obviously with decreasing d Cu. And also when d_Cu<15, the magneto-optical Kerr rotation spectra changes anormalously,Combin-ing the measured results mentioned abuve,a new model is supposed:when d_Cu< 15A, the conductionelectrons in cu layer are pVlarized with oppelte net spin direction with respect to that of FeSi layers. Hence, Kerr rutation spectra is caculated,which agrees approximately with the experimental results.
出处
《东南大学学报(自然科学版)》
EI
CAS
CSCD
1994年第6期119-123,共5页
Journal of Southeast University:Natural Science Edition
基金
东南大学青年基金