摘要
为研究电离辐射致突的分子机理,采用限制性片段长度多态性分析法(RFLPs)观察γ射线诱导的CHO-K1和HeLaMR突变细胞hprt基因结构的变化,并用Northern杂交和狭缝杂交方法分析了CHO-K1突变细胞hprt基因的表达情况。实验结果提示:电离辐射引起hprt基因结构损伤并进而导致mRNA转录的缺陷。
By means of RFLPs method, the alterations of hprt gene structure in the mutant CHO-K1 and HeLa MR cells induced by γ-exposure were examined in order to study the molecular mechanism of gene mutation induced by ionizing radiation; expression of hprt gene in CHO-K1 mutant cells were also observed by Northern blot as well as slot blot. This experiment showed that ionizing radiation could result in hprt gene structure change which might lead to deficiency in mRNA transcription.
出处
《辐射研究与辐射工艺学报》
CSCD
北大核心
1994年第3期164-168,共5页
Journal of Radiation Research and Radiation Processing
基金
国家自然科学基金
关键词
电离辐射
HPRT基因
基因突变
Ionizing radiation
hprt gene
Mammalian cell
RFLPs