摘要
对一种满足２５Ｕ电容标准的ＰＭＺＮ陶瓷的个电老化行为特卢、进行了研究，并分析了材料组成、外电场及温度等因素对其老化行为的影响。研究发现，材料老化是由掺杂（ＭｎＯ２、ＭｇＯ）所诱导，其老化行为与正常铁电体有一定差异。
he aging behavior of Ph (Mg1/3Nb2/3 ) O3-Pb (Zn1/3Nb2/3 ) O3-PbTiO3 ceramic for 25U multilayer capacitors and the influences of the compound composition, aging temperature and testing electric field onaging behavior were studied. It was found that the aging was induced by the dopants of MnO2and MgO andthere was difference in aging behavior between this ferroelectric relaxor and normal ferroelectric BaTiO3.
出处
《高技术通讯》
EI
CAS
CSCD
1994年第3期17-20,共4页
Chinese High Technology Letters
基金
863计划及国家教委重点博士点基金
关键词
弛豫
铁电陶瓷
介电性
老化
: Aging, Ferroelectric relaxor, Capacitor, Lead magnesium niobatc, Lend zinc nobate
