摘要
阐述GIS中支撑绝缘子表面电荷积聚对沿面闪络特性的影响及其闪络机理,分析表面电荷的来源及影响电荷积聚的因素,并介绍利用电容探头测量绝缘子表面电荷分布的方法.
The effect of spacer surface charge in GIS on the flashover charac-teristics along the gas/solid interface is described, and the factors influencing the surface charge accummulation are analysed. The capacitive probe method for mea-suring surface charge distribuion is also presented.
出处
《高压电器》
CAS
CSCD
北大核心
1994年第3期41-45,共5页
High Voltage Apparatus
关键词
封闭式
组合电器
电荷积聚
GIS, insulator, charge, surface, interface flashover, measure-ment
