摘要
研究了一种满足Ｙ５Ｕ指标要求的ＰＭ计ＰＺＮ－ＰＴ介电陶瓷的恒温老化行为与烧成温度的关系，发现在低温烧结要求的温度范围内（９００∽９５０℃），该材料的老化性能满足有关标准，而过高或过低的烧结温度均导致１０倍时间老化率的增大；利用显微结构结构观察分析了上述结果。
The ageing behavior of MgO andMnO_2 doped Pb(Mg_(1/3)Nb_(2/3))O_3-Pb(Zn_(1/3)Nb_(2/3))O_3-PbTiO_3 Ceramics sintered at 800℃、900℃、940℃and 1000℃ respectively were studied and compared.It has been found that for the samples sintered in the temperature range of low firing(i.e.,900～950℃ ),the ageing coefficent K<5%/decade,which sdtisfies the capacitor standard ofEIA. The drop percentage of dielectric constantcaused by ageing is influenced by sintering temperature.The microstructural differences are observedto explain the differences of propexties between different samples.
出处
《功能材料》
CSCD
1994年第3期238-242,共5页
Journal of Functional Materials
基金
八六三计划
国家教委重点博士点基金
