X射线荧光光谱法测定硅酸盐中硫等20个主、次、痕量元素

DETERMINATION OF TWENTY MAJOR, MINOR AND TRACE ELEMENTS IN SILICATE BY XRF SPECTROMETRY

本文使用新研制的偏硼酸锂和四硼酸锂混合熔剂，在１０００℃熔融制样，以Ｘ射线荧光光谱法测定硅酸盐等样品中的Ｓ，Ｎａ，Ｍｇ，Ａｌ，Ｓｉ，Ｐ，Ｋ，Ｃａ，Ｔｉ，Ｍｎ，Ｆｅ，Ｂａ，Ｃｒ，Ｖ，Ｓｒ，Ｚｒ，Ｒｂ，Ｃｕ，Ｎｉ和Ｎｂ等２０种元素，采用理论α系数和康普顿散射线作内标校正元素间的吸收－增强效应。

An XRF spectrometric method has been developed for the determination o.f S, Na,Mg, Al, Si, P, K, Ca, Ti, V, Cr, Mn, Fe, Ba, Sr, Rb, Zr, Cu,Ni and Nb in different geological materials including silicate, clay, bauxite, ultrabasic rocks etc., with a fusion technique, in which a new mix flux of the Li2B4O7 and LiBO2 is used. Interelement absorption and enhancement effects are corrected by using the theoretical alpha coefficients and Rh Ka line Compton scattering radiation as internal standard. The precision and accuracy of the XRF method are excellent as compared with classical chemical method.