摘要
通过降低ＭＣＰ的噪声、减少正离子反馈和扩大动态范围，提出了改善器件电子成像特性和提高探测能力的途径。文中给出了一些实验结果，进行了具体分析。
In this paper,we report and review some technical ways to further improve the characteristic of electron image and to increase the detecting ablilty of devices through lowering thenoise of MCP, decreasing the feedback of positive ions and broadening the dynamic ranges.Recent experimental results are shown and necessary analysis is made.
出处
《光学精密工程》
EI
CAS
CSCD
1994年第3期62-65,共4页
Optics and Precision Engineering
关键词
微通道板
背景噪声
量子噪声
离子反馈
Microchannel plate, Background noise,quantum noise,Feedback of ions,Dynamic ranges.
