摘要
本文研究了LP-MOCVD对不同x值的In1-xGaxAs/InP生长条件,并且生长了压缩应变为0.5%三个不同阱宽的InGaAs/InP量子阱结构,利用77KPL光谱分析了能级同阱宽的关系,实现最窄阱宽为4.4nm,最小全半高峰宽为17.0mev。
The differential composition and growth rate of InGaAs have been studied by Low Pressure Metalorganic Chemical Vapour Deposition(LP.MOCVD).Compressed strainedlayer 3-Quantum Well(MQW)structure with differental well width has been grown。ThePhoto-Luminescence(PL)in 77K were used to characterize the QW structures.The narrownarrowest well width is 4.6nm and Full Width at Half Maxium(FWHM)is 17.0meV。
出处
《光子学报》
EI
CAS
CSCD
1994年第4期313-318,共6页
Acta Photonica Sinica