以“截长补短”法测量自聚焦样品光学参数

THE OPTICAL PARAMETERS OF SELFOCSAMPLE ARE MEASUED BY THE METHOD OF CUTTING THE LONG OR ADDUBG TI TGE SGIRT

利用过焦点光线的等光程性，对截距法做了原理改进，使之能同时测量聚焦常数（二次梯度常数）ｇ和轴心折射率ｎｏ，导出的公式亦可用于加工过程的检验。但所导出公式在测量中使用时应满足其傍轴近似条件，否则测量精度就会降低。

In this paper the vertex focolength (intercept) methed is improved using the equallightpathity o f mys to pass focus,for it can be used to measure the focu-sing (quadratic gradient)constant and the axlal center index simultaneously.The derived fo rmula can be also used to examine products in pro bessing.