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GeⅩⅩ~GeⅩⅩⅥ谱线的测量和辨认

THE XUV SPECTRA IN LASER-PRODUCED Ge PLASMAS
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摘要 测量了线聚焦激光加热锗等离子体发射的XUV光谱,对GeXX~GeXXⅥ谱线进行了辨认和分类。给出了谱线波长和相对强度;计算了辐射跃迁几率和吸收振子强度;并与其它实验室有关结果进行了比较。 The XUV spectra emitted from line focused-laser-produced Ge plasmas were observed.A1-m grazing-incidence spectrograph viewed the plasma in the axial direction. The spectra due to transitions in GeXX~GeXXⅥ were identified.The wavelengtha and intensities of the spectral lines were given. Calculations on spontaneous decay rates and absorption oscillator strengths of the spectra are performed.
出处 《强激光与粒子束》 EI CAS CSCD 1994年第3期455-460,共6页 High Power Laser and Particle Beams
关键词 激光等离子体 谱线辨认 远紫外光谱 laser plasma XUV spectra spectra identification
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